Teradyne
TS 121 ICT
The Teradyne TS 121 ICT is an in-circuit tester. The Teradyne TS 121 ICT is configured with Windows XP and Teradyne Navigate 6.4.0.0.28 software. The Teradyne TS 121 ICT has a Pinboard Type of Ultra 121.[1][2][3]
What it is
How it works
The Teradyne TS 121 ICT supports electrical test functions that include DC voltage sourcing, DC current sourcing, voltage and current measurement, resistance measurement, capacitance measurement, inductance measurement, programmable frequency, and programmable AC level.[1][2]
The Teradyne TS 121 ICT includes automatic vacuum control for clamshell fixtures and a pinboard-based fixture interface.[1][2]
Where it fits in the process flow
General reference — not yet source-verifiedAn in-circuit tester belongs in the board test flow after assembly, where electrical access to nets and components is used to verify population and connectivity.
Applications
General reference — not yet source-verifiedThe Teradyne TS 121 ICT is used for circuit board test and diagnostics in assembled electronics.
What do the numbers mean?
Power & electrical19
Vacuum & pumping2
- Automatic vacuum control for clamshell fixtures[1]
Control & software2
Configuration & options21
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Keysight 3070 Series 3 ICT— Same function class: Test & Probe, nullCompare in depthsource[4]
- Keysight 3070 S 2— Same function class: Test & Probe, nullCompare in depthsource[5]
- Keysight Medalist i 3070 ICT— Same function class: Test & Probe, nullCompare in depthsource[6]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- ConfigurationPower Supplies:[1]
- ConfigurationFixed +5V, 6A[1]
- ConfigurationFixed +15V, 1A[1]
- ConfigurationFixed –15V, 1A[1]
- ConfigurationVariable +20V, 8A (2)[1]
- ConfigurationVariable +60V, 2.5A[1]
- ConfigurationVariable +7V, 15A[1]
- ConfigurationAutomatic vacuum control for clamshell fixtures[1]
- DC voltage source±18V[1]
- DC voltmeter0 to ±200V[1]
- Fixed power supply+5V, 6A[1]
- Fixed power supply+15V, 1A[1]
- Variable power supply+20V, 8A (2)[1]
- Variable power supply+60V, 2.5A[1]
- Variable power supply+7V, 15A[1]
- Automatic vacuum controlFor clamshell fixtures[1]
- Programmable frequency range15Hz to 100kHz[1]
- Programmable drive levels26 levels, +5.5V to -2.5V[1]
- Programmable sense thresholds26 thresholds, +5.5V to -2.5V[1]
- 26 Programmable Drive Levels, Range+5.5V to –2.5V[1]
- 26 Programmable Sense Thresholds, Range+5.5V to –2.5V[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Can an in-circuit tester program devices on the board?General reference — not yet source-verified
Some in-circuit test systems include capability to program programmable devices (e.g., microcontrollers, EEPROMs) via the test fixture, integrating programming and testing in one step. However, this depends on the specific system's features.
How does an in-circuit tester differ from a flying probe tester?General reference — not yet source-verified
In-circuit testers use a fixed bed-of-nails fixture that contacts all test points simultaneously, while flying probe testers use moving probes to make contact sequentially. ICT offers higher throughput but requires a dedicated fixture for each board, making it more suitable for high-volume production. Flying probes are more flexible and better for low-volume or prototype runs.
Not publicly documented
The following facts about the TS 121 ICT are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the TS 121 ICT are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the TS 121 ICT are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the TS 121 ICT are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the TS 121 ICT are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the TS 121 ICT is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]waferpedia.com — waferpedia.comwaferpedia.com
- [3]Teradyne TS 121 ICT family | Waferpedia — waferpedia.comwaferpedia.com
- [4]Equipment inventory listing
- [5]Equipment inventory listing
- [6]Equipment inventory listing
Last updated Oct 10, 2026.
Compare with similar tools
View all →
The Keysight 3070 S 2 is a Test & Probe tool in the Keysight 3070 family.
The Keysight / Agilent 3070 Series 3 is an in-circuit tester (ICT) for printed circuit board assembly testing, requiring 6-7 bar air pressure and consuming 100-170 l/min.
The Keysight Medalist i 3070 ICT is an in-circuit tester in the Test & Probe category.