Waferpedia

Sonoscan

Gen-6

Metrology & Inspection300mmnew generationSonoscan Gen-6 family
Research Quality: 50% complete

The Sonoscan Gen-6 is a C-mode scanning acoustic microscope. The Sonoscan Gen-6 is capable of scanning a 300mm wafer. The Sonoscan Gen-6 includes PolyGate technology with Multi-Gate and Probing-Gate functions.[1][2]

SonoscanGen-6
No photo available yet

Wafer size

300mm

Optics

Open-access illuminated scanning area[1]

How it works

The Sonoscan Gen-6 uses PolyGate technology with Multi-Gate and Probing-Gate functions for single and multi-focus imaging. The instrument supports up to one hundred gates per channel and uses a two gigasamples-per-second sampling rate.[1][2]

The Sonoscan Gen-6 uses an inertially balanced linear motor scanner, a tower-mounted scan reference platform, and a sample fixture. The instrument also supports water recirculation and optional inline temperature control.[1][2]

Where it fits in the process flow

The Sonoscan Gen-6 can scan a single part, JEDEC trays, or a three-hundred-millimeter wafer. The instrument is used on microelectronics, MEMS, SSL LEDs, power modules, solar materials, and other high-technology materials.[1][2]

Applications

The Sonoscan Gen-6 supports inspection of stacked die parts through SonoSimulator and supports digital image analysis for quantitative accept or reject criteria. The instrument also supports virtual rescanning for complete analysis after the sample is no longer available.[1][2]

  • Nondestructive failure analysis
  • Process development
  • High-Rel qualification for a military application
  • Low/medium volume screening
  • Microelectronics
  • MEMS
  • SSL LEDs
  • Power modules
  • Solar
  • HighTech materials

What do the numbers mean?

Wafer handling2

Scan capacity
Capable of scanning JEDEC trays or a 300mm wafer[1]
Accurate?
Wafer size capability
300mm wafer[1]
Accurate?

Optics & imaging1

Scanning area
Open-access illuminated scanning area[1]
Accurate?

Control & software5

Temperature control
Water recirculation and optional inline temperature control[1]
Accurate?
Analysis software
SonoSimulator for simplified analysis of stacked die parts[1]
Accurate?
Control software operating system
Windows 7 Ultimate[1]
Accurate?
Cooling / fluid handling
Water recirculation and optional inline temperature control[1]
Accurate?
Software analysis tools
SonoSimulator, Digital Image Analysis (DIA), and Virtual Rescanning Mode (VRM)[1]
Accurate?

Configuration & options11

Technology
PolyGate™ technology with Multi-Gate™ and Probing-Gate™ functions capable of single and multi-focus imaging[1]
Accurate?
Gates per channel
Up to 100 gates per channel[1]
Accurate?
Sampling rate
2 Gsps[1]
Accurate?
Scanner
Inertially Balanced Linear Motor Scanner[1]
Accurate?
Scan reference platform
Tower-mounted scan reference platform and sample fixture[1]
Accurate?
Scanning area
Open-access scanning area[1]
Accurate?
Data analysis
Digital Image Analysis (DIA) quantifies acoustic data and supports automatic accept/reject criteria[1]
Accurate?
Rescanning
Virtual Rescanning Mode (VRM) stores comprehensive data for complete analysis after the sample is no longer available[1]
Accurate?
Instrument type
C-mode Scanning Acoustic Microscope[1]
Accurate?
Scanner type
Inertially Balanced Linear Motor Scanner[1]
Accurate?
Optional imaging mode
Frequency Domain Imaging (FDI)[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

Does the sample need any special preparation before inspection?General reference — not yet source-verified

No special preparation is typically required, but the sample must be compatible with the coupling fluid (usually deionized water). The surface should be clean and able to be wetted by the fluid. Some samples may need to be dried after inspection.

How does acoustic microscopy differ from X-ray inspection?General reference — not yet source-verified

Acoustic microscopy is sensitive to mechanical discontinuities (gaps, cracks) while X-ray detects density variations and absorbs through materials. Both are complementary: X-ray sees metal structures and voids, while acoustic microscopy is better for finding delamination and cracks in polymer and adhesive layers.

Is the inspection method destructive to the sample?General reference — not yet source-verified

No, scanning acoustic microscopy is a non-destructive inspection method. The sample is immersed in a fluid couplant but experiences no damage, so tested parts can be returned to service or used for further analysis.

Not publicly documented

The following facts about the Gen-6 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Gen-6 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Gen-6 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Gen-6 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Gen-6 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Gen-6 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]ncf.uic.edu — ncf.uic.eduncf.uic.edu
  2. [2]https://ncf.uic.edu/wp-content/uploads/sites/819/2022/04/Scanning-Acoustic-Microscope-Manual.pdf — ncf.uic.eduncf.uic.edu
  3. [3]Instruments and Services | Nanotechnology Core Facility | University of Illinois Chicago — ncf.uic.eduncf.uic.edu
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Last updated Oct 3, 2026.

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