Waferpedia

Accretech

UF 3000 Automatic Wafer

Test & ProbeAccretech UF 3000 family
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The Accretech / TSK UF 3000 is an automatic wafer prober. The UF 3000 supports 8-inch and 12-inch wafers. The UF 3000 includes a 300mm chuck and operates on single-phase 115 Vac power.[1][2]

UF 3000 Automatic Wafer — Inventory photo
Fig. 01UF 3000 Automatic WaferInventory photo[2]

  • Plate 01TSK UF3000 PROBER WAFER DUMMY TEST

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  • Plate 02ACCRETECH UF3000 WAFER DUMMY TEST VIDEO(F240124FB)

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  • Plate 03UF3000 ACCRETECH/TSK Wafer Prober System

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  • Plate 04UF3000 TSK/ACCRETECH Wafer Prober System

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What it is

The Accretech UF 3000 is an automatic wafer prober used for semiconductor test and probe operations.[17][12][1][24][2]

How it works

General reference — not yet source-verified

A wafer prober positions a semiconductor wafer so probe needles can contact selected sites for electrical testing. An automatic wafer prober typically combines wafer handling, precise motion stages, and probe alignment to repeat test contacts across many die locations.

A wafer prober in this class serves as the interface between wafer-level test instrumentation and the wafer under test. The machine holds the wafer on a chuck, moves it to the required position, and supports probe contact so electrical measurements can be taken before downstream assembly.

Why won't it start?

Documented failure modes, common issues, and field considerations.

  • Heating & cooling needs service

What do the numbers mean?

Power & electrical3

Single Phase[2]
Accurate?
Voltage
115 Vac[2]
Accurate?
Power requirement
Single Phase, 115 Vac, 2 Wire + Ground[2]
Accurate?

Wafer handling12

Hot Nickel Chuck[12]
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Right Single Loader[12]
Accurate?
300mm Chuck[2]
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Chuck Surface
Kanigen[3]
Accurate?
Chuck Temp Range
-40℃～150℃[3]
Accurate?
Loader Type
1st[3]
Accurate?
Wafer size
12 inch[1]
Accurate?
Wafer size
8, 12 inch[2]
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Chuck size
300mm[2]
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Included configuration
Hot Nickel Chuck, Right Single Loader, Manipulator, Needle Cleaner (ceramic pad not included), FDD, USB, MO, HDD[12]
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Type
Automatic Wafer Prober[17]
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Wafer Sizes
8 inch, 12 inch[2]
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Configuration & options23

Manipulator[12]
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Needle Cleaner (ceramic pad not included)[12]
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FDD[12]
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USB[12]
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Including
MO, HDD[12]
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2 Wire + Ground[2]
Accurate?
Stock Backing Plate (Has Aehr system backing Plate)[2]
Accurate?
Heating & Cooling needs service[2]
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Without Probe card cleaning platen[2]
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Mitigation Spec (HF)
MHF 6000[3]
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Card Holder Material
SUS[3]
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Card Replacement
APC[3]
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Low Temperature[3]
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280 x 160 Partially Cut[3]
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Tester I/F
GPIB[3]
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CPU Type
Advme 7501[3]
Accurate?
Cleaning Unit Size
280 x 160 Partially Cut[4]
Accurate?
Mitigation Spec (HF)
MHF 4000[13]
Accurate?
Card Holder Material
Nobinite[14]
Accurate?
Cleaning Unit Size
150 x 150[15]
Accurate?
Tri-Temp[16]
Accurate?
Manufacturer
Accretech / TSK[17]
Accurate?
Model
UF 3000[17]
Accurate?
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What replaced it?

Alternatives

Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.

What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • ConfigurationSingle Phase[2]
  • Voltage115 Vac[2]
  • Power requirementSingle Phase, 115 Vac, 2 Wire + Ground[2]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

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Frequently asked questions

What is the primary function of an automatic wafer prober?General reference — not yet source-verified

The primary function is to automatically position a semiconductor wafer and make temporary electrical contact with each die's bond pads via a probe card, enabling electrical testing of the die before they are separated from the wafer.

What types of tests are performed with a prober?General reference — not yet source-verified

Tests can include DC parametric measurements, functional logic tests, memory tests, and analog/mixed-signal checks, depending on the device type and the test system connected to the probe card.

What maintenance considerations are typical for such a machine?General reference — not yet source-verified

Routine maintenance includes cleaning the chuck and probe tips, calibrating the alignment system, and verifying the mechanical accuracy of the chuck movement to maintain contact repeatability and avoid damage to wafers or probes.

Not publicly documented

The following facts about the UF 3000 Automatic Wafer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the UF 3000 Automatic Wafer are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the UF 3000 Automatic Wafer are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the UF 3000 Automatic Wafer are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • The process node or technology generation of the UF 3000 Automatic Wafer is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the UF 3000 Automatic Wafer are on record.

    Answerable by: an OEM parts catalog or a service engineer

Sources & citations

Sources (25)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
  2. [2]Inventory photo
  3. [3]Inventory photo
  4. [4]Inventory photo
  5. [5]Inventory photo
  6. [6]Inventory photo
  7. [7]Inventory photo
  8. [8]Inventory photo
  9. [9]Inventory photo
  10. [10]Inventory photo
  11. [11]Inventory photo
  12. [12]inventory listing
  13. [13]inventory listing
  14. [14]inventory listing
  15. [15]inventory listing
  16. [16]inventory listing
  17. [17]Equipment inventory listing
  18. [18]Equipment inventory listing
  19. [19]Equipment inventory listing
  20. [20]Equipment inventory listing
  21. [21]Equipment inventory listing
  22. [22]Equipment inventory listing
  23. [23]Equipment inventory listing
  24. [24]Equipment inventory listing
  25. [25]Equipment inventory listing
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Last updated Oct 11, 2026.

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