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0010-18024 Pyrometer AssemblyversusSU8230

Applied Materials 0010-18024 Pyrometer Assembly, Hitachi SU8230, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
SU8230Hitachi
OEMApplied MaterialsHitachi
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0010-18024 Pyrometer AssemblyHitachi SU8230
Specifications
ConfigurationCapable of working on Applied Materials Radiance[1]—
Role—Cleanroom scanning electron microscope (SEM)[2]
Facility reference—SEM-10[2]
Manufacturer—Hitachi[2]
Model—SU8230[2]
Training prerequisite note—Qualification on the SEM-10 Hitachi SU8230 is a prerequisite to SP-4 training and access.[2]
Instrument type—Field Emission Gun Scanning Electron Microscope (FEGSEM)[3]
Gun type—Cold field emission (CFE) gun[4]
Resolution at 15 kV—0.8 nm at 15 kV and 4.0 mm working distance[3]
Resolution at 1.0 kV—1.1 nm at 1.0 kV landing voltage and 1.5 mm working distance[3]
Landing voltage range—30 kV to 0.01 kV[3]
Beam deceleration mode landing voltage range—0.01 kV to 2 kV[3]
Magnification range in high magnification mode—100X to 1,000,000X[3]
Magnification range in low magnification mode—20X to 2000X[3]
Sample chamber—6 inch sample chamber[3]
Cryo trap—Integrated LN2 cryo trap[3]
Stage—5-axis motorized stage[3]
Non-cryo stage travel—X/Y 0-110 mm; Z 1.5-40 mm; Tilt -5 to +70; Rotation 360[3]
Cryo stage travel—X/Y approximately +/- 9 mm; Z 1.5-40 mm; Tilt 30 at Z=8 mm or greater, 15 at 5 mm, 0 at 1.5 mm; Rotation 0[3]
Vacuum system—Specimen chamber turbo + scroll dry pump; gun/column ion pumps x3 plus non-evaporative getter[3]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]cns1.rc.fas.harvard.educns1.rc.fas.harvard.edu
  3. [3]cse.umn.educse.umn.edu
  4. [4]ywcmatsci.yale.eduywcmatsci.yale.edu