Comparison ledger
Applied Materials 0010-03485 Magnet Assy, Rigaku 3640 Wafer Disk Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03485 Magnet AssyApplied Materials | 3640 Wafer Disk AnalyzerRigaku |
|---|---|---|
| OEM | Applied Materials | Rigaku |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | 1977– |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-03485 Magnet Assy | Rigaku 3640 Wafer Disk Analyzer |
| Specifications | ||
| Configuration | WP AL 300mm PVD[1] | — |
| OEM | Applied Materials[1] | — |
| Model | 0010-03485[1] | 3640 Wafer / Disk Analyzer[5] |
| Description | MAGNET ASSY, WP AL 300MM PVD[2] | — |
| Process | PVD[3] | — |
| Wafer size | 300mm[4] | 8 inch[5] |
| Version | Spares[4] | — |
| Part Number | 0010-03485[1] | — |
| Manufacturer | Applied Materials[1] | — |
| Process Type | PVD (Physical Vapor Deposition)[1] | — |
| Application (Material) | Aluminum (AL)[1] | — |
| Wafer Diameter (associated) | 300 mm[1] | — |
| Make | — | Rigaku[5] |
| Sample size | — | 8" max.[6] |
| Sample stage | — | XYθ driving system, spin mechanism (for center measurement)[6] |
| Elements for simultaneous analysis | — | 16 elements max.[6] |
| Goniometer | — | Fixed type goniometer for each element; scanning type goniometer for Ti through U[6] |
| Collimator | — | 2 kinds for automatic exchange; selectable from 5, 10, 15 and 20 mm dia.[6] |
| Automatic vacuum degree controller | — | 13 Pa ± 1 Pa (APC: automatic pressure controller)[6] |
| Temperature stabilizer | — | Available[6] |
| X-ray tube | — | Rh target, 3 kW[6] |
| X-ray generator | — | Maximum output: 3 kVA[6] |
| Heat exchanger | — | Distilled water recirculation system (with ion exchange resin)[6] |
| Vacuum pump | — | Dry pump (QDP-80)[6] |
| Cassette-to-cassette | — | Optional[6] |
| Orientation flat/notch | — | Adjustable[6] |
| Software | — | Multiwindow/multitask FP method for multilayer thin film wafer measuring direction setting program[6] |
| Mapping | — | Optional[6] |
| Personal computer | — | DOS/V compatible[6] |
| Operating system | — | OS/2 Warp[6] |
| Display/peripherals | — | 15" color CRT, ink jet printer[6] |