Zeiss
The Zeiss LEO 1560 is a scanning electron microscope (SEM) with a Schottky field emission gun and an in-lens secondary electron detector. The LEO 1560 achieves up to 1 nm resolution at 20 kV accelerating voltage. The LEO 1560 supports 6-inch wafer loading through its loadlock.[1]

Plate 01Used ZEISS scanning electron microscope LEO 1560
Wafer size
6” wafer loading through the loadlock is possible
Power
200 V to 30 kV[3]
Optics
In-lens SE & E-T SE detectors[1]
The Zeiss LEO 1560 is a scanning electron microscope used for metrology and inspection. The model is a field emission SEM.[1][2][3][4]
A scanning electron microscope forms images by scanning a focused electron beam across a specimen and collecting emitted signals from the surface. A field emission SEM uses an electron source that supports fine probing and high beam brightness for imaging small features.
The Zeiss LEO 1560 fits in inspection and metrology operations where detailed surface imaging is needed before or after later process steps. The model is used on wafers and samples rather than for wafer fabrication itself.
Documented failure modes, common issues, and field considerations.
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The LEO 1560 achieves a resolution of 1 nanometer at 20 kilovolts.[1][2][3]
The LEO 1560 uses a field emission gun, specifically a Schottky thermal field emission source, providing a bright and stable electron beam.[1][2][3]
The LEO 1560 can load 6-inch wafers through the loadlock. Maximum wafer diameter loading with the load lock is 4 inches, and loading through the chamber door accommodates up to 6-inch wafers.[1][2]
The LEO 1560 includes an in-lens secondary electron detector, an Everhart-Thornley secondary electron detector, and a Robinson backscattered electron detector.[1][2][3]
The following facts about the LEO 1560 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the LEO 1560 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the LEO 1560 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the LEO 1560 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the LEO 1560 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the LEO 1560 are on record.
Answerable by: an OEM parts catalog or a service engineer
Last updated Oct 7, 2026.
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