Magnum 2 SV

The Teradyne Magnum 2 SV is a member of the Magnum family of automatic test systems, which are precision electronic instruments used by semiconductor manufacturers to validate that integrated circuits function correctly. As a class, these machines are large-format testers that interface with a device under test (DUT) through a test head, applying electrical signals and measuring the DUT's responses under controlled conditions.

Like all ATE of this class, the Magnum 2 SV operates by positioning a DUT against a precision electrical interface—either a probe card for bare wafers or a test socket for packaged parts—and then driving and sensing electrical signals through the device's pins. The system's computer executes a test program that applies voltage and current stimuli, measures the resulting outputs, and compares them against pass/fail limits stored in the program.

The tester typically contains multiple instrument channels, each capable of generating and measuring digital and analog signals, along with a timing system that synchronizes these operations. A handler or prober moves devices into and out of the test position, while the tester itself manages the sequencing, data logging, and binning of devices into categories based on test results.

In the semiconductor fabrication flow, this class of equipment is used at two critical checkpoints. The first is wafer sort (or probe), where the tester, working with a prober, identifies known-good die on a finished wafer before they are cut and packaged. The second is final test, where the same or a similar tester validates the packaged device before it is shipped to a customer or assembled into a larger system.