Teradyne
ETS 364
What it is
How it works
General reference — not yet source-verifiedAutomatic test equipment applies electrical stimuli to a device under test and measures the response through a test interface.
A test system of this class can support multiple measurement and pin resources for digital, analog, timing, and current-related test functions.
Where it fits in the process flow
General reference — not yet source-verifiedA tester of this class sits in the semiconductor verification flow where electrical characterization and functional screening occur before downstream assembly or qualification decisions.
A probe-related test system connects to devices through a probing or handler interface and evaluates dies or parts against electrical requirements.
Applications
Why won't it start?
Documented failure modes, common issues, and field considerations.
- Source states the tester's various instruments have 80 µV resolution.
What do the numbers mean?
Vacuum & pumping1
Control & software3
Configuration & options36
- with Esmo Ikarus Manipulator[7]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest HP / Verigy PS 1600 Smartscale— Same function class: Test & Probe, UnknownCompare in depthsource[9]
- Advantest 93000— Same function class: Test & Probe, UnknownCompare in depthsource[10]
- Advantest V 93000— Same function class: Test & Probe, UnknownCompare in depthsource[11]
- Advantest V 93000 DPS— Same function class: Test & Probe, UnknownCompare in depthsource[12]
- LTX-Credence TMT ASL 1000 165— Same function class: Test & Probe, UnknownCompare in depthsource[13]
- Eagle ETS 200 T— Same function class: Test & Probe, UnknownCompare in depthsource[14]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- System LicenseTurbo[3]
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
- Teradyne / Eagle ETS 364 HCMUX AdapterIn Productionsource[15]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What does a test and probe system do?General reference — not yet source-verified
It makes temporary electrical contact to semiconductor devices and runs automated measurements to determine whether the devices behave as expected.
Where is this class of equipment used in semiconductor manufacturing?General reference — not yet source-verified
It is generally used near the front end of the flow, before packaging, when devices can still be contacted directly for electrical evaluation.
What kinds of tests can such a machine perform?General reference — not yet source-verified
Such systems can perform continuity checks, parametric measurements, and functional electrical testing, depending on the test program and supporting electronics.
Why is probing important in production test?General reference — not yet source-verified
Probing allows temporary access to devices so they can be measured and screened without permanent attachment, which supports early defect detection and sorting.
Not publicly documented
The following facts about the ETS 364 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the ETS 364 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the ETS 364 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the ETS 364 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the ETS 364 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly hosted manuals, SOPs, or datasheets for the ETS 364 are on record.
Answerable by: university cleanroom staff or an OEM application specialist
Sources & citations
Sources (19)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]inventory listing
- [7]inventory listing
- [8]inventory listing
- [9]Equipment inventory listing
- [10]Equipment inventory listing
- [11]Equipment inventory listing
- [12]Equipment inventory listing
- [13]Equipment inventory listing
- [14]Equipment inventory listing
- [15]Equipment inventory listing
- [16]Equipment inventory listing
- [17]Equipment inventory listing
- [18]Production Board Test (PCB testing) - Teradyne — teradyne.com (May 5, 2026)web.archive.org
- [19]CN103905044A - Stair-step voltage ramp module including programmable gain amplifier - Google Patents — patents.google.compatents.google.com
Last updated Oct 6, 2026.
Compare with similar tools
View all →
The Advantest 93000 is a tester with listed dedicated, infrastructure, digital, and DC components.
The Eagle ETS 200 T is a semiconductor test system for discrete device testing and wafer sort to final test applications.
The PS 1600 Smartscale is a semiconductor test system from Advantest/Agilent/HP/Verigy, introduced in 2012 and including components such as PS 1600 modules, DPS 32, and a Compact Test Head.
General referenceThe LTX-Credence TMT ASL 1000 165 is a semiconductor automated test system used in the test and probe segment of integrated-circuit manufacturing for verifying device electrical behavior.
