RECIF
G 3 Plus Wafer
The RECIF G 3 Plus Wafer is a test and probe tool. The RECIF G 3 Plus Wafer is a wafer handler and sorter for 300mm wafers.[1][2]
What it is
How it works
General reference — not yet source-verifiedA wafer sorter in this class typically uses automated handling to route wafers or wafer carriers through loading, transfer, and unloading steps.
A test and probe tool in this class typically brings probe hardware into contact with wafer sites so that electrical testing can be performed at wafer level.
Where it fits in the process flow
The RECIF G 3 Plus Wafer belongs in the test and probe portion of semiconductor manufacturing.[1]
Applications
What do the numbers mean?
Power & electrical1
Wafer handling1
Control & software3
Configuration & options11
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Voltage110V AC[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
How does the system handle wafer alignment?General reference — not yet source-verified
Alignment is typically achieved through optical cameras that locate alignment marks on the wafer, combined with precision stage motion to align the wafer to the probe card before contacting.
What is the typical throughput of such systems?General reference — not yet source-verified
Throughput varies widely based on the number of dies, test complexity, and probe card configuration, but these systems are designed to balance speed with accurate placement and reliable electrical contact.
What maintenance is required for probe cards?General reference — not yet source-verified
Probe cards require periodic cleaning to remove debris and maintain low contact resistance, along with inspection for needle damage or wear. Some systems include automatic cleaning and calibration routines.
Not publicly documented
The following facts about the G 3 Plus Wafer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the G 3 Plus Wafer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the G 3 Plus Wafer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the G 3 Plus Wafer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the G 3 Plus Wafer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the G 3 Plus Wafer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (5)Every fact above is drawn from these public sources
- [1]waferpedia.com — waferpedia.comwaferpedia.com
- [2]RECIF G 3 Plus Wafer family | Waferpedia — waferpedia.comwaferpedia.com
- [3]Inventory photo
- [4]Inventory photo
- [5]agsemiconductor.comagsemiconductor.com
Last updated Oct 11, 2026.
Compare with similar tools
View all →The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
