MKS
Provisional entry — research in progress
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The MKS ozone family is used in semiconductor thin-film processes such as Atomic Layer Deposition, Chemical Vapor Deposition, Atomic Layer Etch, oxide growth, and photoresist removal.[2][4][3]
The MKS ozone family is used for semiconductor thin-film deposition and related oxidation processes.[2]
The AX8415 supports semiconductor, flat panel display, and photovoltaic applications.[4]
The O3CS supports thin-film processes that use ozone with metal oxides such as Al2O3, ZrO2, HfO2, and La2O3.[3]
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The MKS ozone product family supports Atomic Layer Deposition, Chemical Vapor Deposition, Atomic Layer Etch, oxide growth, and photoresist removal.[2][4][3]
The O3CS uses Grade 6 or better oxygen, and it can use nitrogen or carbon dioxide as an additional gas species.[3]
The AX8415 produces ozone up to 425 g/Nm3, or 27.1 wt% at 5°C at 2.5 slm with nitrogen.[4]
The O3CS includes an integrated ozone concentration monitor, flow control for oxygen and dopant gas species, an electronic pressure controller, and closed-loop ozone concentration control.[3]
The following facts about the Ozone are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Ozone are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Ozone are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Ozone are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Ozone are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Ozone is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 7, 2026.