Waferpedia

KLA

Profilm 3 D Optical

Metrology & InspectionKLA Profilm family
Research Quality: 40% complete
KLAProfilm 3 D Optical
No photo available yet

Vacuum

0 – 3 µm[2]

Optics

50 nm – 100 mm[2]

What it is

The KLA Profilm 3 D Optical is a non-contact optical profilometer for three-dimensional surface topography measurement.[4][3]

The Profilm 3 D Optical is part of the KLA Instruments metrology and inspection category.[5]

How it works

The Profilm 3 D Optical uses white light interferometry and phase-shifting interferometry to measure surface topography.[4][3][2]

Where it fits in the process flow

The Profilm 3 D Optical fits in metrology and inspection workflows where surface form, step height, roughness, and other topographic features are measured after fabrication or processing.[3]

Applications

The Profilm 3 D Optical measures step height, surface roughness, trench and via depth, dimensions, particles, grains, volume, bearing ratio, and flatness.[3]

What do the numbers mean?

Vacuum & pumping4

UPG-PSI Upgrade Profilm acquisition system to - PSI capability[1]
Accurate?
Measurement principle
Vertical Scanning Interferometry (VSI) and Phase-Shifting Interferometry (PSI)[2]
Accurate?
Thickness range (PSI)
0 – 3 µm[2]
Accurate?
Model configuration
OBJ-10X-Mirau 10x Nikon Mirau interferometric objective lens; WSProfilm3D-200 manual rotating (r-theta) stage for 200mm wafers; Profilm-AnalysisSoftware permanent license; UPG-PSI upgrade; Accurion Nano30 active vibration isolation system; stitching not included[1]
Accurate?

Wafer handling1

WSProfilm3D-200 Manual rotating (r-theta) stage for 200mm wafers[1]
Accurate?

Optics & imaging3

OBJ-10X-Mirau 10x Nikon Mirau interferometric objective lens[1]
Accurate?
Thickness range (VSI)
50 nm – 100 mm[2]
Accurate?
Objectives
5X, 10X, 20X, 50X, 100X[3]
Accurate?

Control & software3

Profilm3D Profilm-AnalysisSoftware[1]
Accurate?
Profilm desktop analysis software - permanent license[1]
Accurate?
Analysis Software for stitching XY grid of images[1]
Accurate?

Dimensions & facilities3

SHS-CrOnSi-Multi-4um Step-height standard with 4um, 2um, and 100nm steps[1]
Accurate?
Sample max width
265 mm (Profilm3D); 365 mm (Profilm3D-200)[3]
Accurate?
System weight
15 kg (Profilm3D); 22 kg (Profilm3D-200)[3]
Accurate?

Configuration & options9

Stitching not included[1]
Accurate?
Cr surface on 1.25" square Si[1]
Accurate?
Vibration Isolation[1]
Accurate?
Nano30 Active vibration isolation system[1]
Accurate?
Accurion Nano30 UPG[1]
Accurate?
Stitching Upgrade Profilm[1]
Accurate?
Reflectance range
0.05% – 100%[2]
Accurate?
Piezo scan range
500 µm[2]
Accurate?
XY stage options
100 mm × 100 mm or 200 mm × 200 mm[2]
Accurate?
Interested in this tool?
Need help with this tool?Embed spec card

What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • ConfigurationUPG-PSI Upgrade Profilm acquisition system to - PSI capability[1]
  • Measurement principleVertical Scanning Interferometry (VSI) and Phase-Shifting Interferometry (PSI)[2]
  • Thickness range (PSI)0 – 3 µm[2]
  • Model configurationOBJ-10X-Mirau 10x Nikon Mirau interferometric objective lens; WSProfilm3D-200 manual rotating (r-theta) stage for 200mm wafers; Profilm-AnalysisSoftware permanent license; UPG-PSI upgrade; Accurion Nano30 active vibration isolation system; stitching not included[1]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Worked with this tool? Help preserve its knowledge →

Frequently asked questions

What measurement methods does the Profilm 3 D Optical use?

The Profilm 3 D Optical uses white light interferometry and phase-shifting interferometry.[4][3][2]

Not publicly documented

The following facts about the Profilm 3 D Optical are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Profilm 3 D Optical are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Profilm 3 D Optical are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Profilm 3 D Optical are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Profilm 3 D Optical are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Profilm 3 D Optical is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (5)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]instrumenthive.com — instrumenthive.cominstrumenthive.com
  3. [3]kla.com — kla.comkla.com
  4. [4]Filmetrics Profilm3D Optical Profilometers | KLA Instruments — kla.comkla.com
  5. [5]Profilm 3 D Optical — KLA | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Was this page accurate?

Last updated Oct 10, 2026.

Compare with similar tools

View all →