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KLA

Candela CS 10 Surface

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

Candela CS 10 Surface — Inventory photo
Fig. 01Candela CS 10 SurfaceInventory photo[1]

What it is

The KLA Candela CS 10 Surface Inspection System is a semiconductor surface inspection and metrology instrument.[1][3][4]

The Candela CS 10 belongs to a class of non-contact optical inspection tools used to detect and classify surface defects on semiconductor substrates.[4]

How it works

The Candela CS 10 uses optical inspection to detect surface anomalies without contact.[4]

The Candela CS 10 class uses scattered light, reflected light, phase-shift contrast, and Z-height topography to localize and classify defects.[4]

Where it fits in the process flow

The Candela CS 10 is used in semiconductor manufacturing environments for inspection of wafers and other substrates.[4]

Applications

The Candela CS 10 is applied to bare and patterned wafers, compound semiconductor substrates, and transparent materials.[4]

The Candela CS 10 is used for detecting surface anomalies including particles, residues, scratches, digs, and topographic variations.[4]

What do the numbers mean?

Power & electrical4

Single Phase[1]
Accurate?
Phase
Single Phase[1]
Accurate?
Frequency
50/60 Hz[1]
Accurate?
Voltage
230 V AC[3]
Accurate?

Wafer handling1

Wafer sizes
3 inch[2]
Accurate?

Configuration & options9

50/60Hz[1]
Accurate?
Make
KLA[1]
Accurate?
Model
Candela CS 10[1]
Accurate?
Equipment type
Surface Inspection System[1]
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Vintage
2005[1]
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Description name
KLA-Tencor Candela CS-10 Surface Analyzer Candela[3]
Accurate?
Current
5 A[3]
Accurate?
Maximum AC
10 K[3]
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Vintage
2009[3]
Accurate?

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
Candela CS10/CS20——The source groups CS10 and CS20 as related models and states manual operation for CS10 and automated transport for CS20.instrumenthive.com[4]
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • ConfigurationSingle Phase[1]
  • PhaseSingle Phase[1]
  • Frequency50/60 Hz[1]
  • Voltage230 V AC[3]

Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What kind of substrates can the Candela CS 10 inspect?

The Candela CS 10 inspects bare and patterned wafers, compound semiconductor substrates such as GaAs, SiC, and GaN, and transparent materials such as quartz, sapphire, and fused silica.[4]

What defect types does the Candela CS 10 target?

The Candela CS 10 targets particles, residue, scratches, digs, pits, and topographic variations.[4]

Not publicly documented

The following facts about the Candela CS 10 Surface are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Candela CS 10 Surface are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the Candela CS 10 Surface are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Candela CS 10 Surface are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Candela CS 10 Surface is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the Candela CS 10 Surface are on record.

    Answerable by: an OEM parts catalog or a service engineer

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Sources & citations

Sources (4)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]Inventory photo
  3. [3]semistarcorp.com — semistarcorp.comsemistarcorp.com
  4. [4]instrumenthive.com — instrumenthive.cominstrumenthive.com
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Last updated Oct 11, 2026.

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