Waferpedia

KLA

5100

KLA 5100 family
Research Quality: 40% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The KLA 5100 Overlay Measurement System is a metrology and inspection tool for measuring overlay on 8-inch wafers. The KLA 5100 uses optical microscopes for measurement functions.[1]

KLA5100
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What it is

The KLA 5100 is an overlay measurement system used in semiconductor wafer fabrication.[1][2]

The KLA 5100 belongs to the metrology and inspection portion of wafer fabrication.[1]

The KLA 5100 is part of the KLA 5100 family, which also includes the 5100 XP Overlay Measurement system.[2]

How it works

The KLA 5100 uses optical microscopes for measurement functions.[1]

The KLA 5100 includes a 12k microscope and a 750 micron field-of-view microscope with a light source.[1]

The 50 micron field-of-view microscope on the KLA 5100 performs optical measurement, interferometer measurement, and autofocus.[1]

Where it fits in the process flow

The KLA 5100 is used in the metrology and inspection portion of wafer fabrication.[1]

Applications

The KLA 5100 is used for overlay measurement on 8-inch wafers.[1]

The KLA 5100 measures steps from 100 Å to 300 µm.[1]

What do the numbers mean?

Vacuum & pumping2

Sample table
200 mm with vacuum[1]
Accurate?
Sample table
200 mm sample table with vacuum[1]
Accurate?

Wafer handling3

Wafer handling
Dual SMIF Cassette loader, 200mm[1]
Accurate?
Measurement application
overlay measurement on wafers[1]
Accurate?
Wafer size
8-inch wafers[1]
Accurate?

Optics & imaging4

Optics
12k and 750 micron FOV optical microscopes with light source[1]
Accurate?
Microscope
50 micron FOV with optical measurement, interferometer measurement, and autofocus[1]
Accurate?
Optical system
optical microscopes for measurement functions[1]
Accurate?
Microscope functions
50 micron field-of-view microscope performs optical measurement, interferometer measurement, and autofocus[1]
Accurate?

Control & software4

Software
Windows NT / VAX[1]
Accurate?
Operating system
VMS[1]
Accurate?
Control software
Windows NT / VAX software[1]
Accurate?
Operating system
OS VMS[1]
Accurate?

Configuration & options9

Step measurement range
100 Å to 300 µm[1]
Accurate?
Maximum sample thickness
20 mm[1]
Accurate?
Minimum sample length
25 mm[1]
Accurate?
Backup
SCSI back up unit[1]
Accurate?
Printer
Thermal mini printer[1]
Accurate?
Tool type
metrology and inspection tool[1]
Accurate?
Microscope set
12k microscope and a 750 micron field-of-view microscope with a light source[1]
Accurate?
Measurement range
100 Å to 300 µm[1]
Accurate?
Backup unit
SCSI Back up unit[1]
Accurate?

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
5100 XP Overlay Measurement———waferpedia.com[2]
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Sample table200 mm with vacuum[1]
  • Sample table200 mm sample table with vacuum[1]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What wafer size does the KLA 5100 use?

The KLA 5100 is configured for 8-inch wafers.[1][2]

What does the KLA 5100 measure?

The KLA 5100 measures overlay on wafers.[1][2]

What measurement range is given for the KLA 5100?

The KLA 5100 measures steps from 100 Å to 300 µm.[1]

What sample handling features are given for the KLA 5100?

The KLA 5100 has a 200 mm sample table with vacuum, a maximum sample thickness of 20 mm, and a minimum sample length of 25 mm.[1]

Not publicly documented

The following facts about the 5100 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 5100 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the 5100 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 5100 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 5100 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the 5100 are on record.

    Answerable by: an OEM parts catalog or a service engineer

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]waferpedia.com — waferpedia.comwaferpedia.com
  2. [2]waferpedia.com — waferpedia.comwaferpedia.com
  3. [3]Equipment inventory listing
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Last updated Oct 7, 2026.

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