Waferpedia

Keysight

4071

Test & ProbeKeysight 40xx family
Research Quality: 40% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

Keysight4071
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What it is

The Keysight 4071 is a PCM tester.[1]

How it works

General reference — not yet source-verified

The class of probe-and-test equipment evaluates electrical behavior by contacting devices or test structures through probes and applying test stimuli while measuring responses.

Where it fits in the process flow

General reference — not yet source-verified

Probe-based testers are used during semiconductor test flows to measure wafer-level structures before later assembly or final test steps.

A PCM tester is used on process-control structures that help characterize electrical behavior across a fabrication flow.

Applications

General reference — not yet source-verified

A PCM tester is used for wafer-level electrical test of process-control monitor structures.

Probe-and-test equipment is used to check semiconductor devices and test patterns before downstream packaging or product screening.

What do the numbers mean?

Wafer handling1

Wafer size (with prober)
8 inch[1]
Accurate?

Configuration & options4

With Electroglas EG 4090 & EG 4090 u Prober (8")[1]
Accurate?
Type
PCM Tester[1]
Accurate?
Prober
Electroglas EG 4090 & EG 4090 u[1]
Accurate?
Vintage
1998[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What type of instrument is the Keysight 4071?

The Keysight 4071 is a PCM (process control monitor) tester used for parametric testing of semiconductor wafers.[1]

Not publicly documented

The following facts about the 4071 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4071 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 4071 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 4071 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 4071 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 4071 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]OR gate - Wikipedia — en.wikipedia.orgen.wikipedia.org
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Last updated Oct 10, 2026.

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