Ismeca
NX 116
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Ismeca NX 116 is a tester used in semiconductor test and probe applications. The NX 116 operates with 1-phase power at 60 Hz.[1][2]
What it is
How it works
General reference — not yet source-verifiedA wafer prober positions a wafer with sub-micrometer accuracy under a probe card. The probe card contains an array of sharp needles that make temporary electrical contact with the die pads. The tester unit then applies voltage and current stimuli to the device under test (DUT) and compares the measured electrical parameters to specification limits. Testing may include parametric measurements, functional logic patterns, and analog performance checks. The entire process is automated, with alignment cameras and pattern recognition software to ensure accurate probe placement.
What do the numbers mean?
Power & electrical1
Configuration & options3
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Frequency60 Hz[2]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the NX 116 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NX 116 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the NX 116 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the NX 116 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the NX 116 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the NX 116 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]waferpedia.com — waferpedia.comwaferpedia.com
Last updated Oct 10, 2026.
