Hitachi
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The Hitachi CG 4000 CD-SEM is a Critical Dimension Scanning Electron Microscope that supports 12-inch wafer sizes.[1]

The Hitachi CG 4000 is a CD-SEM (Critical Dimension Scanning Electron Microscope).[4][1][5]
CD-SEMs operate by scanning a focused electron beam across the sample surface. The beam interacts with the sample, generating secondary electrons and backscattered electrons, which are detected to form an image. By analyzing the image, algorithms can extract accurate dimensional information, often with nanometer-scale precision.
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The following facts about the CG 4000 CD-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
Fewer than 3 independently cited specifications for the CG 4000 CD-SEM are on record; the remainder await public documentation.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the CG 4000 CD-SEM are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the CG 4000 CD-SEM are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the CG 4000 CD-SEM are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the CG 4000 CD-SEM are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Sep 28, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.