Electroglas
Horizon 4080 X
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Electroglas Horizon 4080 X is a wafer prober from Electroglas. The Horizon 4080X supports an optional Bottom Probe Card Changer for rapid changing of probe cards. The Horizon 4080X's Bottom Probe Card Changer provides quick and easy front-loading and unloading of probe cards without undocking the test head.[1][2][3]
What it is
How it works
General reference — not yet source-verifiedA wafer prober uses a motorized chuck to move a wafer in X, Y, and theta axes to align each die under a set of probe pins mounted in a probe card.
An optical vision system locates alignment marks on the wafer and calculates the position of each die before it is stepped under the probe card for contact.
Where it fits in the process flow
General reference — not yet source-verifiedWafer probers are also employed for in-line parametric testing during fabrication and for end-of-line reliability verification.
What do the numbers mean?
Wafer handling1
Configuration & options10
Vintage & configurations
- 1992Production start[4]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What wafer sizes can an automatic wafer prober handle?General reference — not yet source-verified
Automatic wafer probers are typically designed to handle a range of common wafer diameters, but specific size compatibility depends on the machine's chuck and handling mechanism. Most probers can accommodate multiple sizes through a combination of hardware options and recipe parameters.
How is alignment accuracy maintained in a wafer prober?General reference — not yet source-verified
Alignment is achieved through optical pattern recognition systems that identify alignment marks on the wafer. The prober uses closed-loop servo control to position the chuck precisely, and calibration routines are performed regularly to compensate for thermal drift and mechanical wear.
What types of probe cards are compatible with wafer probers?General reference — not yet source-verified
Wafer probers accept various probe card types, including epoxy-ring, membrane, and vertical-probe cards. The interface is standardized (e.g., the industry-standard probe card interface), and compatibility depends on the prober's configuration and the number of probe contacts required by the device.
What factors affect throughput in a wafer prober?General reference — not yet source-verified
Throughput is influenced by the time per die contact, alignment speed, stepping velocity, settling time, and the number of test sites. Maintenance of the probe needles and periodic cleaning also affect sustained throughput. Overall throughput is determined by the combination of prober mechanics, test system performance, and the test program.
Not publicly documented
The following facts about the Horizon 4080 X are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented variants, configuration options, or revision breakpoints of the Horizon 4080 X are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Horizon 4080 X are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Horizon 4080 X are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Horizon 4080 X is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Horizon 4080 X are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (5)Every fact above is drawn from these public sources
- [1]web.archive.org — electroglas.com (Nov 10, 1999)web.archive.org
- [2]Inventory photo
- [3]Inventory photo
- [4]sec.gov — sec.gov (Mar 26, 1997)sec.gov
- [5]Inventory photo
Last updated Oct 3, 2026.
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