Cohu
Eclipse
The Cohu Eclipse is a handler. The Cohu Eclipse includes a T 5832 ES tester configuration. The Cohu Eclipse includes 200-240 V power and 50/60 Hz operation.[1]
What it is
The Cohu Eclipse is a pick-and-place semiconductor test handler.[2]
How it works
The handler uses recirculating chillers for temperature control during test. In one configuration, it includes an OptiTemp UA 000670 AA recirculating chiller and a Shinwa Controls CH 7 H 9 S 0 chiller.[1]
The handler includes a flow box, an Eclipse XT Teach Tool Kit, and an Eclipse XT Alignment Tool Kit.[1]
Where it fits in the process flow
General reference — not yet source-verifiedThe Eclipse handler is used in the final test stage of semiconductor manufacturing, after wafer sort and assembly. Packaged devices are tested and sorted before being shipped to customers.
What do the numbers mean?
Power & electrical4
Wafer handling1
Performance2
- Eclipse XT Alignment Tool Kit[1]
Control & software3
Configuration & options14
- With T 5832 ES Tester (P/N E908/79)[1]
- Includes:[1]
- Shinwa Controls CH 7 H 9 S 0 Chiller[1]
- DGAC DDECLIPSE / AVT 5832 ES Mounting Fixture[1]
- Flow Box[1]
- Eclipse XT Teach Tool Kit[1]
- Included manipulator
- Intest EMS Cobal 25 AVT 5832 ES / DUT UP Test Head Manipulator, P/N: 930905 C (2021 Vintage)[1]
- Included chiller
- OptiTemp UA 000670 AA Recirculating Chiller, ref R 449 A R 508 B (2021 Vintage)[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What types of packages can a test handler of this class handle?General reference — not yet source-verified
Pick-and-place test handlers are designed to handle a variety of surface-mount packages, such as QFP, BGA, QFN, and SOIC, as well as molded carrier ring, lead-frame, and laminate packages. The specific package range depends on the handler's site design and change kit configuration.
How does a test handler achieve high throughput?General reference — not yet source-verified
Throughput is achieved by parallel test sites, fast indexing mechanisms, and synchronized pick-and-place robotics. The handler minimizes device transfer times and can test multiple devices simultaneously if the tester supports parallel test within the same contactor set.
What is the typical binning strategy used in these handlers?General reference — not yet source-verified
Devices are binned based on test results into categories such as pass, fail, and multiple speed or voltage grades. The handler can sort into numerous physical bins, and the bin assignment is controlled by the test program, which communicates pass/fail and grade information to the handler's control system.
What are the key maintenance considerations for a pick-and-place test handler?General reference — not yet source-verified
Regular maintenance includes cleaning contactor and probe surfaces, recalibrating pick-and-place robots, and verifying alignment. Also important are lubrication of moving parts, inspection of wear-prone components such as belts and grippers, and periodic replacement of vacuum seals and sensor elements.
How does a test handler interface with the automatic test equipment (ATE)?General reference — not yet source-verified
The handler uses electrical and communication interfaces to coordinate with the tester. Typically, the handler sends a 'device present' signal, the tester applies stimuli and measures response, then sends a binning command back. The interface may be based on a standard protocol like GPIB, Ethernet, or proprietary digital lines.
Not publicly documented
The following facts about the Eclipse are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Eclipse are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Eclipse are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Eclipse are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Eclipse are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Eclipse is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]The State of Semiconductors - Tignis | Cohu — cohu.com (May 9, 2026)web.archive.org
Last updated Oct 1, 2026.
