Bruker
ContourGT X 3 D Optical Profiler
The Bruker ContourGT X 3 D Optical Profiler is a Precision Optics instrument. The Bruker ContourGT X 3 D Optical Profiler has a single-phase electrical configuration. The Bruker ContourGT X 3 D Optical Profiler has an AC input of 115/230 V.[1][2]
What it is
How it works
General reference — not yet source-verifiedA profiler of this class uses optical sensing to characterize height variation, roughness, and shape across a surface.
A profiler of this class supports precision measurement in laboratory and production environments where noncontact surface metrology is needed.
Where it fits in the process flow
General reference — not yet source-verifiedA profiler of this class is used to verify surface condition during inspection, process control, and failure analysis work.
Applications
General reference — not yet source-verifiedA profiler of this class is used where noncontact measurement is preferred for delicate or highly finished surfaces.
What do the numbers mean?
Power & electrical5
Optics & imaging1
Configuration & options3
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Wyko HD8000— Same function class: Precision Optics, UnknownCompare in depthsource[2]
- Filmetrics Profilm3D— Same function class: Precision Optics, UnknownCompare in depthsource[2]
- Wyko NT-2000— Same function class: Precision Optics, UnknownCompare in depthsource[2]
- Zygo NewView 8000— Same function class: Precision Optics, nullCompare in depthsource[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the ContourGT X 3 D Optical Profiler are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the ContourGT X 3 D Optical Profiler are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the ContourGT X 3 D Optical Profiler are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the ContourGT X 3 D Optical Profiler are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the ContourGT X 3 D Optical Profiler are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the ContourGT X 3 D Optical Profiler is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]waferpedia.com — waferpedia.comwaferpedia.com
- [2]Inventory photo
- [3]Bruker ContourGT X 3 D Optical Profiler family | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 5, 2026.
Compare with similar tools
View all →The Wyko HD8000 is a non-contact optical profiler for magnetic thin-film heads that measures pole-tip recession or ABS flatness in less than 3 seconds.
The Zygo NewView 8000 is a non-contact benchtop 3D optical surface profiler for surface characterization and metrology.
The WYKO NT-2000 is a non-contact optical profiler for ultra-precise 3-D surface measurement and process control.
Profilm3D is a Filmetrics optical profiler used for profilometry-based film thickness measurements and 3D surface profiling.
