Accretech
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The Accretech A PM 60 B prober uses a manipulator to position fine probes onto specific locations on a wafer surface. The probes are brought into contact with contact pads or device terminals to perform electrical measurements. The system typically includes a stage with X-Y-Z movement and a microscope for visual alignment. External instruments such as source-measure units or parameter analyzers are connected to the probes to apply voltages and measure currents. The operation can be manual or automated depending on configuration.[1]
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| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| A PM 60 B / EM 11 A | — | — | — | waferpedia.com[1] |
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The Accretech A PM 60 B is a wafer prober, categorized under test and probe equipment.[2][3][1]
The manufacturer is Accretech, often shown together with the TSK name.[2][1]
The operation can be manual or automated depending on configuration.[1]
External instruments such as source-measure units or parameter analyzers are connected to the probes to apply voltages and measure currents.[1]
The following facts about the A PM 60 B are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the A PM 60 B are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the A PM 60 B are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the A PM 60 B are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the A PM 60 B are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the A PM 60 B is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 29, 2026.