Waferpedia

Tool family

KLA F 40 Thin Film Thickness Measurement

KLA1 entry

Models in this family

  1. The KLA Filmetrics F40 is a microscope-based thin-film measurement instrument that uses spectral reflectance technology to measure thickness and optical constants.

    Cited variants

    DesignationGenerationVintageChangesSource
    F40——Wavelength range 400–850 nm, thickness range 20 nm–40 µm (5X objective)kla.com[1]
    F40-UV——Wavelength range 190–1100 nm, thickness range 4 nm–40 µm (5X objective)kla.com[1]
    F40-EXR——Wavelength range 400–1700 nm, thickness range 20 nm–150 µm (2X objective)kla.com[1]
    F40-NIR——Wavelength range 950–1700 nm, thickness range 100 nm–120 µm (5X objective)kla.com[1]
    F40-UVX——Wavelength range 190–1700 nm, thickness range 4 nm–120 µm (5X objective)kla.com[1]
    F40-XT——Wavelength range 1440–1690 nm, thickness range 0.4 µm–250 µm (2X objective)kla.com[1]

Sources

Sources (1)Every fact above is drawn from these public sources
  1. [1]kla.comkla.com