Comparison ledger
KLA .498 PSL Wafer, Onto Innovation MP 1 300 Film Thickness Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MP 1 300 Film Thickness MeasurementOnto Innovation | |
|---|---|---|
| OEM | KLA | Onto Innovation |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .498 PSL Wafer | Onto Innovation MP 1 300 Film Thickness Measurement |
| Cited variants | — |
|
| Specifications | ||
| Configuration | NIST Traceable[2] | — |
| NIST traceability | Yes[2] | — |
| Wafer Size | — | 12 inch (300 mm)[3] |
| Measurement Type | — | Film Thickness[3] |
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