Comparison ledger
KLA 1007, Teradyne ASM 2160, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | ASM 2160Teradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne ASM |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | Compatible with Teradyne Eagle ETS 364Tester[3] |
| Test channels | — | Up to 16 independent[4] |
| Test card slots | — | Up to 16[4] |
| Recipe storage | — | Up to 16 recipes[4] |
| I/O interfaces | — | Ethernet, USB, LVDS, GPIB[4] |
| Compatibility | — | Teradyne Eagle ETS 364 tester[3] |
| Design application | — | Automotive electronics[5] |
| Power supply | — | Integrated AC/DC[5] |
| Control | — | Programmable logic controller[5] |
| Software tools | — | Multi-site management, PC operation support[5] |
| Data export | — | Network printer, Microsoft Word, Excel[4] |
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