Comparison ledger
KLA 1007, LTX-Credence PE 3000, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | PE 3000LTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence PE 3000 |
| Specifications | ||
| Manufacturer | KLA[1] | LTX-Credence[4] |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | for integrated circuit process manufacturing[3] |
| Category | — | Test & Probe[4] |
| Tool type | — | tester[4] |
| Application | — | integrated circuit process manufacturing[4] |
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