Comparison ledger
KLA 1007, LTX-Credence ASL 1000 ATE, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | ASL 1000 ATELTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence ASL 1000 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | Automatic test equipment system[3] |
| Configuration | — | Slot / Card:[3] |
| Category | — | Test & Probe[4] |
| Slot / Card 1 | — | Octal VI 671-3032-36 Rev DA[3] |
| Slot / Card 2 | — | Octal VI 671-3032-36 Rev DA[3] |
| Slot / Card 3 | — | Octal VI 671-3032-36 Rev DA[3] |
| Slot / Card 4 | — | Pulsed VI 671-4681-01 Rev A[3] |
| Slot / Card 5 | — | HVS/OFS/MVS 671-5337-00 RevB[3] |
| Slot / Card 6 | — | TMU 671-5333-RevA[3] |
| Slot / Card 7 | — | Digital 671-5334- Rev C[3] |
| Slot / Card 8 | — | Pulsed VI 671-7096-00 CC[3] |
| Slot / Card 9 | — | Quad VI 671-4678-25[3] |
| Slot / Card 11 | — | Quad Vi 671-4678-25[3] |
| Slot / Card 12 | — | Quad VI 671-4678-25[3] |
| Slot / Card 13 | — | Quad VI 671-4678-25[3] |
| Slot / Card 14 | — | Mux 671-4682-0 Rev A[3] |
| Slot / Card 15 | — | HVS/OFS/MVS 671-5336-00 RevCC[3] |
| Slot / Card 16 | — | Mux 671-4682-0 Rev A[3] |
| Slot / Card 17 | — | HVS/OFS/MVS 671-5337-00 RevB[3] |
| Slot / Card 18 | — | LZB 671-4680-02 Rev BA[3] |
| Slot / Card 19 | — | HVS/OFS/MVS 671-5337-00 RevB[3] |
| Slot / Card 20 | — | Mux 671-4682-0 Rev A[3] |
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