Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Hitachi S 4800 I, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | S 4800 IHitachi |
|---|---|---|
| OEM | Applied Materials | Hitachi |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Hitachi S 4800 |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | Tilt motion：-5° to +70°[2] |
| Main body | — | 1set including Tip, Objective aperture, Ion Pump, SE detection etc.[2] |
| Diplay unit | — | 1set including PC, monitor, keyboard, mouse, etc[2] |
| Chiller | — | Option if there is no water source[2] |
| Resolution | — | 1.0 nm (Accelerating voltage: 15 kV, WD: 4mm; 2.0 nm (Accelerating voltage: 1 kV, WD: 1.5 mm)[2] |
| Magnification | — | 30 to 2,000x in LM mode; 100 to 800,000 in HM mode[2] |
| Resolution (15 kV, WD 4mm) | — | 1.0 nm[2] |
| Resolution (1 kV, WD 1.5 mm) | — | 2.0 nm[2] |
| Magnification (LM mode) | — | 30 to 2,000x[2] |
| Magnification (HM mode) | — | 100 to 800,000x[2] |
| Tilt motion | — | -5° to +70°[2] |
| Operating system | — | Windows 2000[2] |
| Main body components | — | Tip, Objective aperture, Ion pump, SE detection[2] |
| Display unit components | — | PC, monitor, keyboard, mouse[2] |
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