Waferpedia

Comparison ledger

V 93000versusJ 750

Advantest V 93000, Teradyne J 750, side by side. Every value shown is drawn from the cited encyclopedia entries.

Documented as functional equivalents— Same function class: Test & Probe, Unknown[1]
Side-by-side comparison of selected equipment models
Attribute
V 93000Advantest
J 750Teradyne
OEMAdvantestTeradyne
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system—Windows XP SP3
Generation——
FamilyAdvantest V 93000Teradyne J 750
Specifications
ConfigurationAC:[1]512 Pins[4]
MBAV8 4S4M BMCB 8 Units: 4 SRC + 4 MEAS[1]—
ACDC PSCabinet Primary Power Supply (3)[1]—
DCDC ACage Secondary Power Supply[1]—
DCDC UCage Secondary Power Supply (3)[1]—
PS800Pin scale 800 MB/S (21)[1]—
MSDPS AMultisite DPS 8 Ch 8V/4A (4)[1]—
UHC4Ultra High Current DPS[1]—
Board—Channel[4]
PN—239-001-04 1 ed 182 0945-D 5445[4]
Computer OS Version—Windows XP SP3[5]
IG-XL Version—3.50.40[5]
Phase—3 Phase[6]
Voltage—208 VAC, 30 A, 50/60 Hz[9]
Borad—CUB[4]
Make—Teradyne[4]
Model—J 750[4]
Pin count—512 pins[4]
Electrical input—3 Phase - 3 Wire + PE - 50/60 Hz - 30 A, 208 Vac[6]
Application context—wafer-form integrated circuit testing[10]
Probe-station docking—A-type configuration[10]

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Sources (10)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing
  3. [3]inventory listing
  4. [4]inventory listing
  5. [5]inventory listing
  6. [6]inventory listing
  7. [7]inventory listing
  8. [8]inventory listing
  9. [9]inventory listing
  10. [10]patents.google.compatents.google.com