Comparison ledger
KLA .496 PSL Wafer, Onto Innovation FFH NSX 105 Automatic Defect, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | FFH NSX 105 Automatic DefectOnto Innovation | |
|---|---|---|
| OEM | KLA | Onto Innovation |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .496 PSL Wafer | Onto Innovation FFH NSX 105 Automatic Defect |
| Specifications | ||
| Configuration | NIST Traceable[1] | 50/60Hz[3] |
| Wafer size | 8 inch[1] | — |
| Traceability | NIST Traceable[1] | — |
| Compatible systems | Capable on Surfscan 6xy0 and SP1[1] | — |
| Category | Metrology & Inspection[2] | — |
| Power | — | 220-240 VAC[3] |
| Full Load | — | 10Amps[3] |
| Largest Load | — | 1.5Amps[3] |
| Power Voltage | — | 220-240 VAC[3] |
| Power Frequency | — | 50/60 Hz[3] |
| Full Load Current | — | 10 Amps[3] |
| Largest Load Current | — | 1.5 Amps[3] |
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