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Comparison ledger

2139versus2139 Brightfieldversus2139 UI Brightfield Patterned Surface Defect

KLA 2139, KLA 2139 Brightfield, KLA 2139 UI Brightfield Patterned Surface Defect, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
2139KLA
OEMKLAKLAKLA
Category—Metrology & InspectionMetrology & Inspection
Wafer size———
Process node———
Introduced———
Production run———
Lifecycle———
Lifecycle milestones———
Control system———
Generation———
FamilyKLA 2139KLA 2139KLA 2139
Specifications
Model2139[1]2139[7]2139 UI Brightfield Patterned Surface Defect[9]
OEMKLA-Tencor[1]KLA[7]KLA[9]
Wafer Size200mm[1]——
Cassette HandlingDual Open Cassette[1]——
Tool TypeSurface Inspection System[1]——
Voltage—208 VAC[2]—
Phase—3 Phase[2]—
Configuration—30 A[2]Ultra-Broadband Illumination[8]
Full load—30A[3]—
Power—60[4]—
Wafer inspector software—Rev. V5.4.010[5]—
Full Load Current—30 A[2]—
Frequency—50/60 Hz[2]—
Vintage—1996[2]—
Wafer sizes—6 inch, 8 inch[2]—
Current (full load)—30 A[2]—
Software—WIN NT[6]—
Type—Brightfield Inspection[7]—
Wafer Sizes—6, 8 inch[2]—
Electrical—208 VAC, 3 Phase, 30 A, 50/60 Hz[2]—
Category——Metrology & Inspection[8]
Wafer size——8 inch[8]
Sources (9)Every fact above is drawn from these public sources
  1. [1]classoneequipment.comclassoneequipment.com
  2. [2]inventory listing
  3. [3]inventory listing
  4. [4]inventory listing
  5. [5]inventory listing
  6. [6]inventory listing
  7. [7]Equipment inventory listing
  8. [8]waferpedia.comwaferpedia.com
  9. [9]inventory listing