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Comparison ledger

.204 PSL Waferversus7600 Patterned Wafer Particle Defect

KLA .204 PSL Wafer, KLA 7600 Patterned Wafer Particle Defect, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size—25 Wafer Slot Cassette
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA .204 PSL WaferKLA 7600 Patterned Wafer Particle Defect
Specifications
ConfigurationNIST Traceable[1]Cassette Transfer[4]
Wafer Size8 inch[1]—
TraceabilityNIST[2]—
Compatible ToolsSurfscan 6xy0, Sp1[1]—
NIST TraceableYes[1]—
Wafer size—25 Wafer Slot Cassette[3]
Process Vac—23 InHg[4]
Inlet Power—1 line of 208 Vac 15 Amp[3]
Manufacturer—KLA[3]
Category—Metrology & Inspection[3]
Cassette transfer—Included[3]
Scan stage—Included[3]
Wafer transfer—Included[3]
Boat elevator / robot transfer—Included[3]
Exhaust—Exhaust with Blower for laser cooling[3]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]waferpedia.comwaferpedia.com
  4. [4]inventory listing