Comparison ledger
KLA 1007, Teradyne Nextest Magnum 2 EV Automated Memory, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne Nextest Magnum |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | Magnum 2 EV[5] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | Teradyne / Nextest[5] |
| Equipment type | Prober[2] | Automated Memory Tester[5] |
| Configuration | — | 120/240V[3] |
| Phase | — | 1 Phase[3] |
| Wafer Size | — | 12 inch[5] |
| Electrical | — | 120/240V - 50/60Hz - 1 Phase - 13/6.5 Amps[3] |
| Control Workstation | — | Includes Dell control workstation[3] |
| Voltage | — | 120/240V[3] |
| Frequency | — | 50/60Hz[3] |
| Amps | — | 13/6.5 Amps[3] |
| Includes Dell control workstation | — | Yes[3] |
| Included accessory | — | Dell control workstation[3] |
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