Comparison ledger
KLA 1007, Teradyne Magnum 5 EV Memory, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Magnum 5 EV MemoryTeradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne Magnum |
| Specifications | ||
| Manufacturer | KLA[1] | Teradyne[3] |
| Model | 1007[1] | Magnum 5 EV[3] |
| Description | Wafer Prober[1] | Memory Tester[4] |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 01.06.2018[4] |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Mainframe | — | 512 ZIF Interface Support[3] |
| Quad Site Assembly config | — | 1.6Gbps, HSBx, DPS128ER, 17[3] |
| Configuration | — | 512 digital channels[3] |
| ECR or DBM | — | 518311 option, 64 bit, ECR or DBM, M5[3] |
| Row/Column Memory (RCM) Option | — | 518317 option, 64MB, RCM, M5[3] |
| Test site controller | — | 1[3] |
| Algorithmic pattern generators | — | 4[3] |
| DUT power supplies | — | 128[3] |
| System PMU | — | 32[3] |
| High voltage pins | — | 128[3] |
| Host computer | — | Windows Server 2012, Visual Studio 2013, UI6.x[3] |
| Memory option | — | 518311 option, 64 bit, ECR or DBM, M5[3] |
| System option | — | 518337 Single 22" LED monitor[3] |
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