Comparison ledger
KLA 1007, Teradyne J 750 EX HD, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | J 750 EX HDTeradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne J 750 EX HD |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | HSD 800 x8 pcs[3] |
| Platform designation | — | J750Ex-HD Platform[4] |
| Product category | — | Digital/Mixed Signal Test[4] |
| Documented configuration | — | HSD 800 x8, HDDPS 24 x2, Trea 3 workstation, manipulator[3] |
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