Comparison ledger
KLA 1007, LTX-Credence X-Series LX 20 ATE, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | X-Series LX 20 ATELTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence X-Series |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | With Docking and Manipulator from Turbodynamics[3] |
| Slot 1 | — | Instrument: SSBA[3] |
| Slot 2 | — | Instrument: OVI[3] |
| Slot 3 | — | instrument: Empty[3] |
| Slot 4 | — | Instrument: DCTM[3] |
| Slot 5 | — | Instrument: Empty[3] |
| Slot 6 | — | Instrument: Empty[3] |
| Slot 7 | — | Instrument: QFVI[3] |
| Slot 8 | — | Instrument: HEXVI 16[3] |
| Slot 9 | — | Instrument: AWG_HR[3] |
| Slot 10 | — | Instrument: Empty[3] |
| Slot 11 | — | Instrument: QFVI[3] |
| Slot 12 | — | Instrument: Empty[3] |
| Slot 13 | — | Instrument: Empty[3] |
| Slot 14 | — | Instrument: Empty[3] |
| Slot 15 | — | Instrument: FX 1_PEC[3] |
| Slot 16 | — | Instrument: FX 1_PEC[3] |
| Slot 17 | — | Instrument: FX_TMBD[3] |
| Slot 18 | — | Instrument: FX 1_PEC[3] |
| Slot 19 | — | Instrument: FX 1_PEC[3] |
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