Comparison ledger
Applied Materials 0720 06060 Part, Chroma 3110, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | 3110Chroma |
|---|---|---|
| OEM | Applied Materials | Chroma |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Chroma 3110 |
| Cited variants | — |
|
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[2] | Tri-temp[3] |
| Product type | — | Hybrid single-site test handler[4] |
| FT compatibility | — | FT compatible handler[4] |
| SLT compatibility | — | SLT compatible[4] |
| Thermal control | — | ATC tri-temp -40 to 150 ℃[4] |
| Optional IC test temperature range | — | -55 to 150 ℃, -70 to 150 ℃[4] |
| Auto tray loading/unloading | — | Auto tray loading/unloading and device sorting capability[4] |
| Device body capacity | — | Up to 120x120 mm[4] |
| Contact force | — | 80/180 kgf[4] |
| Optional contact force | — | 450 kgf[4] |
| Optional liquid submersion system | — | Available[4] |
| Applications | — | AI chips, automotive semiconductors, HPC related test, other advanced packaged semiconductors[4] |
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