Comparison ledger
Applied Materials 0720 06060 Part, Bruker Tesp, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | TespBruker |
|---|---|---|
| OEM | Applied Materials | Bruker |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Bruker Tesp |
| Cited variants | — |
|
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[2] | — |
| Equipment type | — | Test & Probe[3] |
| Model | — | Tesp[4] |
| Asset description | — | Prober[4] |
| Variant designation | — | TESP-V2[1] |
| Geometry | — | Rectangular[1] |
| Frequency | — | Nominal 320 kHz[1] |
| Spring constant | — | Nominal 37 N/m[1] |
| Tip radius | — | Nominal 7 nm[1] |
| Length | — | Nominal 123 µm[1] |
| Width | — | Nominal 40 µm[1] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →