Comparison ledger
Applied Materials 0720 06060 Part, Bruker Oltespa, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | OltespaBruker |
|---|---|---|
| OEM | Applied Materials | Bruker |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Bruker Oltespa |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | — |
| Category | — | Test & Probe[2] |
| Model | — | Oltespa[3] |
| Tool type | — | Prober[3] |
| Probe model | — | OLTESPA-R4[4] |
| Probe geometry | — | Rectangular[4] |
| Tip radius | — | 7 nm nominal; 10 nm max[4] |
| Frequency | — | 70 kHz nominal; 50-90 kHz range[4] |
| Spring constant | — | 2 N/m nominal; 0.6-3.5 N/m range[4] |
| Cantilever length | — | 240 µm nominal; 225-255 µm range[4] |
| Cantilever width | — | 40 µm nominal; 38-42 µm range[4] |
| Cantilever thickness | — | 2.3 µm nominal; 1.6-3.0 µm range[4] |
| Cantilever material | — | Silicon[4] |
| Back-side coating | — | Reflective Al[4] |
| Tip height | — | 14 µm nominal; 9-19 µm range[4] |
| Front angle | — | 0°[4] |
| Back angle | — | 35°[4] |
| Side angle | — | 18°[4] |
| Substrate material | — | N-type doped silicon; resistivity 0.01-0.02 Ω·cm[5] |
| Reflective coating | — | 100 nm Al on backside[5] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →