Comparison ledger
Applied Materials 0010-03485 Magnet Assy, KLA UV 1250 SE Thin Film Thickness Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03485 Magnet AssyApplied Materials | |
|---|---|---|
| OEM | Applied Materials | KLA |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-03485 Magnet Assy | KLA UV 1250 SE |
| Specifications | ||
| Configuration | WP AL 300mm PVD[1] | Open casette[5] |
| OEM | Applied Materials[1] | — |
| Model | 0010-03485[1] | UV 1250 SE[7] |
| Description | MAGNET ASSY, WP AL 300MM PVD[2] | wafer film measurement instrument; ellipsometer[8] |
| Process | PVD[3] | — |
| Wafer size | 300mm[4] | 8 inch[5] |
| Version | Spares[4] | — |
| Part Number | 0010-03485[1] | — |
| Manufacturer | Applied Materials[1] | — |
| Process Type | PVD (Physical Vapor Deposition)[1] | — |
| Application (Material) | Aluminum (AL)[1] | — |
| Wafer Diameter (associated) | 300 mm[1] | — |
| KLA PN | — | 28-0144 has been removed[6] |
| Make | — | KLA[7] |
| Open cassette | — | Open casette[8] |
| Windows NT software version | — | 4.0.1381[5] |
| Summit software version | — | 2.62.06[5] |
| Tester firmware version | — | 3.1.0[5] |
| Maker | — | KLA[7] |
| Wafer handling | — | Open cassette[8] |
| Software | — | Windows NT software version 4.0.1381; Summit software version 2.62.06[5] |
| Tester firmware | — | 3.1.0[5] |
| Control software | — | Windows NT software version 4.0.1381; Summit software version 2.62.06[5] |