Comparison ledger
Applied Materials 0010-03485 Magnet Assy, Keysight 4155 C Semiconductor Parameter Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03485 Magnet AssyApplied Materials | |
|---|---|---|
| OEM | Applied Materials | Keysight |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-03485 Magnet Assy | Keysight 4155 C Semiconductor Parameter Analyzer |
| Cited variants | — |
|
| Specifications | ||
| Configuration | WP AL 300mm PVD[2] | — |
| OEM | Applied Materials[2] | — |
| Model | 0010-03485[2] | 4155 C[6] |
| Description | MAGNET ASSY, WP AL 300MM PVD[3] | — |
| Process | PVD[4] | — |
| Wafer size | 300mm[5] | — |
| Version | Spares[5] | — |
| Part Number | 0010-03485[2] | — |
| Manufacturer | Applied Materials[2] | Keysight / Agilent[6] |
| Process Type | PVD (Physical Vapor Deposition)[2] | — |
| Application (Material) | Aluminum (AL)[2] | — |
| Wafer Diameter (associated) | 300 mm[2] | — |
| Instrument type | — | Semiconductor Parameter Analyzer[6] |
| Included software | — | Desktop EasyEXPERT standard edition[1] |
| Measurement functions | — | dc or pulsed force/measure, stress force, voltage/current sweep, sampling (time domain), and C-V measurement[1] |
| Maximum number of sampling points | — | 10,001 (linear)[1] |
| Maximum number of VAR1 sweep steps | — | 1001[1] |