Comparison ledger
Agilent 11980 A, Perkin Elmer Frontier FTIR, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | Frontier FTIRPerkin Elmer |
|---|---|---|
| OEM | Agilent | Perkin Elmer |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | Perkin Elmer Frontier FTIR |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[1] | — |
| Configuration | — | Refurbished[2] |
| Instrument type | — | Fourier transform infrared (FTIR) spectrometer[2] |
| Mid-IR range | — | 8300–350 cm⁻¹[3] |
| Far-IR range | — | 700–30 cm⁻¹[3] |
| Best resolution | — | 0.4 cm⁻¹[3] |
| Total spectral range | — | 8300 to 350 cm⁻¹[4] |
| Detector | — | LiTaO3 MIR detector[4] |
| ATR accessory | — | Single-bounce diamond attenuated total reflectance (ATR) accessory[5] |
| Measurement resolution used in cited study | — | 2 cm⁻¹ resolution averaged over 16 scans[5] |
| Sample compartment accessory | — | Mint Sample Compartment[2] |
| UATR accessory | — | PE UATR with Diamond / ZnSe Crystal[2] |
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