Waferpedia

Comparison ledger

V 93000 C (2 CC) DUT Test Headversus1034

Advantest V 93000 C (2 CC) DUT Test Head, Electroglas 1034, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
1034Electroglas
OEMAdvantestElectroglas
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyAdvantest V 93000Electroglas 1034
Cited variants—
Specifications
ConfigurationRev 004[3]—
Digital CardsHSM8G x2, Digital pPogos: HD256 x2[3]—
DPS CardsDCS-DPS32 x1, DCS-VI32 x1, (Missing E5810 LAN/GPIB Gateway)[3]—
Digital cardsHSM8G x2, digital pogos: HD256 x2[4]—
DPS cardsDCS-VI32 x1[4]—
Revision004 / 005[3]—
Digital PogosHD256 x2 (Rev 004), x3 (Rev 005)[2]—
CTH Engineering CartIncluded[3]—
Control WorkstationIncluded[3]—
OEMAdvantest[3]—
ModelV 93000 C (2 CC)[3]—
Equipment typeDUT Test Head[3]—
Digital pogosHD256 x2[3]—
Included itemsCTH engineering cart; control workstation[3]—

Plan your fab

Building a Test & Probe process? Get a complete equipment list.

Open the fab equipment planner →
Sources (4)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
  2. [2]Equipment inventory listing
  3. [3]inventory listing
  4. [4]inventory listing