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93000 SOC alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Teradyne
J 750 EX
Test & Probe
The Teradyne J 750 EX is a tester manufactured by Teradyne.
Teradyne
J 750 S
Test & Probe
The Teradyne J 750 S is a tester that requires 3-phase power at 208 Vac, 30 A, 50/60 Hz.
Teradyne
MicroFlex
Test & Probe
The Teradyne MicroFlex is a semiconductor automatic test equipment (ATE) platform for testing integrated circuits.
Teradyne
Nextest Magnum 1 PV
Test & Probe
The Teradyne Nextest Magnum 1 PV is a semiconductor tester categorized under Test & Probe, with electrical ratings of 50/60 Hz, 200-240 Vac, and 16A.
Teradyne
Nextest Magnum I PV
Test & Probe
The Teradyne Nextest Magnum I PV is a semiconductor test and probe system.
LTX-Credence
TMT ASL 1000 165
Test & Probe
The LTX-Credence TMT ASL 1000 165 is a semiconductor automated test system used in the test and probe segment of integrated-circuit manufacturing for verifying device electrical behavior.
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