Comparison ledger
Accretech UF 3000 EX-e, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | UF 3000 EX-eAccretech | 1007KLA |
|---|---|---|
| OEM | Accretech | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Accretech UF 3000 | KLA 1007 |
| Specifications | ||
| Configuration | Dual-temp DD 93K[1] | — |
| Temperature capability | Dual-temp DD 93K[1] | — |
| Chuck type | Low noise hot chuck[2] | — |
| Cleaning unit size | 150 x 160mm[2] | — |
| Probe card interface | T 2000 ISS 64PARA 440mm Card[2] | — |
| Tester interface | MHF 6000[2] | — |
| Interface type | GPIB, Ethernet, Remote SS UI[2] | — |
| Option | FFU (Fan Filter Unit)[2] | — |
| Power supply | Single Phase[2] | — |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →